广东工业大学学报 ›› 2014, Vol. 31 ›› Issue (2): 117-120.doi: 10.3969/j.issn.1007-7162.2014.02.023

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异质结薄膜的铁电、磁性能及漏电流研究

李万朋,刘秋香   

  1. 广东工业大学 物理与光电工程学院, 广东 广州 510006
  • 出版日期:2014-06-06 发布日期:2018-06-13
  • 作者简介:李万朋(1989),男,硕士研究生,主要研究方向为铁电薄膜.
  • 基金资助:
    广东省自然科学基金资助项目(10151009001000050)

Ferroelectric, Magnetic Properties and Leakage Currents of SrBi2Ta2O9/LaNiO3 Heterostructure Thin Films

Li Wanpeng, Liu Qiuxiang   

  1. School of Physics and Optoelectric Engineering, Guangdong University of Technology, Guangzhou 510006, China
  • Online:2014-06-06 Published:2018-06-13
  • Supported by:
     

摘要: 采用溶胶凝胶方法在Si(100)衬底上生长了SrBi2Ta2O9/LaNiO3 (SBT/LNO)异质结薄膜,其中SrBi2Ta2O9薄膜呈高度(115)取向.测量了不同退火温度下异质结的电滞回线和漏电流密度,结果表明,700 ℃下退火的薄膜剩余极化值最高,漏电流最低,且表现出弱的室温铁磁行为.漏电流机理分析表明薄膜界面为欧姆接触.

关键词: 钽酸锶铋, 漏电流密度, 铁电, 铁磁

Abstract: SrBi2Ta2O9(SBT)/LaNiO3 (LNO) heterostructure thin films were grown on Si(100) substrate by using a solgel process. XRD results reveal high (115) orientation of SrBi2Ta2O9 thin film. The hysteresis loops and leakage current density of the films annealed at different temperatures were measured. The film annealed at 700 ℃ showes the lowest leakage current density and a well saturated PE hysteresis loop with the largest remnant polarization (Pr) of 716 uC/cm2. Leakage mechanism analysis suggests an Ohmic conduction. In addition, the SBT/LNO heterostructures annealed at 700 ℃ exhibit a weak roomtemperature ferromagnetic behavior.

Key words: SrBi2Ta2O9, leakage current density, ferroelectric, ferromagnetic

中图分类号: 

  • O611
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