Abstract: In this paper,the failure models of electronic components under a variety of stresses are introduced,as well as its corresponding reliable stress screening methods.Meanwhile,the paper mainly emphasizes on the environmental stress screening methods,accelerated factor and environmental factor,which provide proper guidance for the electronic products to choose reasonable stress level in reliable stress screening.Finally,by giving an engineering test example,the effects of the reliable stress screening are(illustrated.)

Key words: components； EES； acceolerated factor； environmental factor；