Journal of Guangdong University of Technology ›› 2008, Vol. 25 ›› Issue (3): 36-39.
• Comprehensive Studies • Previous Articles Next Articles
[1] 代新,林福昌,李劲,姚宗干. 高场强下金属化膜脉冲电容器失效的原因[J]. 高电压技术. 2000(05) [2] 郭大德. 金属化膜电容器的损耗分析及损坏机理[J]. 电力电容器. 1995(02) [1] Yang K,,Xue J.Continuous state reliability analysis. Proc.Annual Reliability and Maintainability Sym-posium . 1996 [2] Huang W.Reliability analysis considering product perform-ance degradation. . 2002 [3] Crk V.Reliability assessment from degradation data. Proc Annual Reliability and Maintainability Sympo-sium . 2000 [4] Oliveira V R B,Colosimo E A.Comparison of methods toestimate the time-to-failure distribution in degradation tests. Quality and Reliability . 2004 [5] Ennis J B,Macdougall F W,Cooper R A,et al.Self-Heal-ing pulse capacitors for the national ignition facility(NIF). IEEE International Pulsed Power Conference . 1999 [6] Ming J Z.Approaches for Reliability Modeling of Continuous-state Devices. IEEE Transactions on Reliability . 1999 |
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