广东工业大学学报 ›› 2005, Vol. 22 ›› Issue (1): 7-9.

• 综合研究 • 上一篇    下一篇

退火温度对锆酸铅薄膜光学性能的影响

  

  1. 广东工业大学实验中心; 广东工业大学应用物理学院; 暨南大学物理系 广东广州510090; 广东广州510090; 广东广州510632;
  • 出版日期:2005-03-02 发布日期:2005-03-02

Effect of Annealing Temperature on the Optical Properties of PbZrO3Thin Films

  1. (1. Experiment Centre, Guangdong University of Technology, Guangzhou 510090,China; 2.Faculty of Applied Physics, Guangdong University of Technology, Guangdong 510090, China 3.Dept. of Physics, Jinan University, Guangzhou 510632, China)
  • Online:2005-03-02 Published:2005-03-02

摘要: 用溶胶-凝胶法在石英玻璃基片上成功地制备了PbZrO3(PZ)薄膜.X射线衍射分析结果表明晶化好的PZ薄膜,是多晶钙钛矿结构.750℃晶化的薄膜,晶粒尺寸为30~50nm.用紫外-可见光分光光度计在波长200~900nm范围内,测量了不同温度退火的PZ薄膜的透射率,结果表明450、600、750℃退火的薄膜样品,其光学吸收边分别为4.11、4.56、4.59eV. 

关键词: PbZrO3薄膜; 光学特性; 吸收边;

Abstract: PbZrO(3)(PZ) thin films grown on fused quartz substrates are prepared by sol-gel process. The crystal structure of PZ thin films has been studied by XRD. The results show that the well-crystallized PZ thin film is pseudocubic phase. When the film on fused quartz substrate is annealed at 750?℃, the grain size is about 30~50?nm. The optical transmittance spectra of the PbZrO(3)thin films on fused quartz substrates annealed at 450, 600 and 750?℃ are measured with a double-beam UV-VIS scanning spectrophotometer. The transmission spectra of the samples are measured, using air as a reference at a wavelength range 200 to 900?nm. The results show that the band gaps are 4.11, 4.56 and 4.59?eV, respectively, for the films annealed at 450, 600 and 750?℃.

Key words: PbZrO3thin film; optical property; band gap;

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