电子元器件的可靠性筛选

广东工业大学学报 ›› 2006, Vol. 23 ›› Issue (1): 67-70.

电子元器件的可靠性筛选

广东工业大学实验中心；信息产业部电子第五研究所广东广州510090；广东广州510090；广东广州510630；

出版日期:2006-02-02 发布日期:2006-02-02
基金资助:
信息产业部科研预研基金资助项目(H122003A001)

The Reliable Stress Screening of Electronic Components

(1.Engineering and Experiment Center,Guangdong University of Technology,Guangzhou 510090,China;2.The Fifth Research Instiute(Electronics)of MII,Guangzhou 510610,China)

Online:2006-02-02 Published:2006-02-02

摘要/Abstract

摘要： 论述了电子元器件在各种应力下的可能失效模式和相应的筛选方法,重点论述了环境应力筛选,以及环境应力筛选的加速因子和筛选度的计算,为电子产品选择合理的可靠性筛选应力水平提供了指导.最后以工程实例说明了可靠性应力筛选的效果.

关键词: 电子元器件；环境应力筛选；加速因子；筛选度；

Abstract: In this paper,the failure models of electronic components under a variety of stresses are introduced,as well as its corresponding reliable stress screening methods.Meanwhile,the paper mainly emphasizes on the environmental stress screening methods,accelerated factor and environmental factor,which provide proper guidance for the electronic products to choose reasonable stress level in reliable stress screening.Finally,by giving an engineering test example,the effects of the reliable stress screening are(illustrated.)

Key words: components； EES； acceolerated factor； environmental factor；

杨少华；吴福根；黄瑞毅； . 电子元器件的可靠性筛选[J]. 广东工业大学学报, 2006, 23(1): 67-70.

YANG Shao-hua~1,WU Fu-gen~1,HUANG Rui-yi~2. The Reliable Stress Screening of Electronic Components[J]. Journal of Guangdong University of Technology, 2006, 23(1): 67-70.

参考文献

[1] 周玉芬,高锡俊,李建华,范卫军. 环境应力筛选加速系数[J]. 航空精密制造技术. 2003(05)

[1] 王少萍编著.工程可靠性[M]. 北京航空航天大学出版社, 2000

[2] 孙青等编著.电子元器件可靠性工程[M]. 电子工业出版社, 2002

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